Software


Software

- GSR Emulators
- BallisticSEM
- SurveyXT

 

GSR Emulators

GSR-XT Emulator – Software to allow off-line analysis of GSR run data from GSR-XT

Description:
Virtually identical to the online version of GSR-XT, GSR-XT Emulator allows you to review run data off line and remotely from the Quanta. It also allows modification of class definitions and subsequent automatic reclassification of run data.
The program is also useful for training new users of GSR-XT.

Specification and requirements:
1) PC screen resolution of 1280 x 1024, min 65K colours, and large fonts
2) W2000 Professional or XP

To order:
Part number GSR_XT_EM - Available directly from Eastern Analytical €1600

GSR-NT Emulator - Software to allow off-line analysis of GSR run data from GSR-NT
Description:
Virtually identical to the online version of GSR-NT V3.4a, GSR-NT Emulator allows you to review run data off line and remotely from the Quanta. It also allows modification of class definitions, and subsequent automatic reclassification of run data.
The program is also useful for training new users of GSR-NT.

Specification and requirements:
1) W2000 or Windows NT

To order:
Part number GSR_NT_EM - Available directly from Eastern Analytical €1600

GSR-2002 Emulator - Software to allow off-line analysis of GSR run data from GSR-2002
Description:
Virtually identical to the online version of GSR-2002 V3.4CS, GSR-2002 Emulator allows you to review run data off line and remotely from the Quanta. It also allows modification of class definitions, and subsequent automatic reclassification of run data.
The program is also useful for training new users of GSR-2002.

Specification and requirements:
1) W2000 or Windows NT

To order:
Part number GSR_2002_EM - Available directly from Eastern Analytical €1600

BallisticSEM

Software for the examination and comparison of ballistic evidence in the SEM.

Features

• Software interface to FEI ballistic substages
• Acquires images from
• Quanta
• Edax
• Any digital video (DV) source
• Multi-format image portfolio tool
• Flatview tm pattern comparison tool
• Quanta interface look and feel

Product description
Comparisons of bullets and cartridge cases are commonly performed in the optical comparison microscope. In some cases, however, it may be advantageous to examine the same materials in a scanning electron microscope. The images from such samples taken in an SEM show very different characteristics compared with those obtained by optical microscopy. Electron microscope images can show details of the surface chemistry of the ballistic materials and contaminants adhering to them. These features can be observed using the backscattered electron signal in the SEM or be chemically analyzed using the SEM's EDS X-ray analyzer

BallisticSEM permits microscopists to conveniently image the surfaces of bullets and cartridge cases. The system allows manipulation of two bullets or cartridge cases in a similar way to the stages provided with optical ballistic comparison microscopes. Both samples can be rotated continuously and independently in the SEM vacuum.

Fig. 1: Electron and optical image of 9mm bullet mounted on BallisticSEM substage

The BallisticSEM system software enables the convenient and efficient comparison images of the two samples or with library images.

The software rapidly acquires the images of samples using either the SE, BSE or optical images of the sample. The optical images can be obtained from an external optical microscope or from the optional in-column boroscope optical imaging system. The software can gather images from the SEM's signal sources (SE and BSE) or via integrated frame grabbers (RS-170 CCTV or IEEE 1384 Firewire DV), or simply from storage over the network.


Fig. 2: BallisticSEM software showing two main reference images and image portfolio.

The two main images can be live simultaneously and can have differently optimized acquisition characteristics (contrast, brightness, and other CODEC parameters) if the installed hardware allows this.

The two images can be compared interactively using live overlay, and a resulting combined image formed by merging the two images The result is convenient, direct comparison and documentation of features.

The integrated measuring tool provides direct and interactive measurement of distances on the sample surfaces. There is also an integrated tool for automatic calibration of SEM magnification. Images be stored in a wide variety of currently popular as well as older formats.

Collections of ballistic images can be compiled into portfolios. The portfolios can contain images from any source, be of any resolution and image file type, and can be at different storage locations (worldwide).

The optional Flatview™ facility permits the images of the curved surfaces of bullets and cartridge cases to be automatically scanned and compiled into portfolios. Flatview™ images are images whose Y-axis is a near one-dimensional image slice through the sample, and whose X-axis represents degrees of sample rotation. These images make comparisons of the entire cylindrical surfaces of samples simple and convenient.

Fig. 3: Flat view of 9mm cartridge casing

Flatview™ software provides a tool for directly comparing two flat images and for interactive adjustment of relative image positions and rotation phase. Once a match has been reached between the two images, a combined image can be formed and saved for later reference.

Fig. 4: Interactive comparison of Flatview™ images

Fig 5:Ballistic comparison substage showing bullets, cartridge cases and motors.



Specifications
BallisticSEM - Ballistic Comparison Substage
• Accommodates bullets and cartridge casings for all common ammunition
• Direct comparison or two independently rotatable samples (2 motors)
• Rotation via table-top controls
• Substage mount compatible with GSR relocating substage system without removal of GSR standard.
• Rotation speeds from 1 to 40°/second
• Bidirectional rotation

BallisticSEM Ballistic Comparison Software
• Live viewing and comparison of images from two independent video sources
• Live images can be taken from SEM directly (overlay), via RS-170 CCTV capture devices (Osperey and Coreco), IEEE1394 Firewire Digital Video sources such as cameras and camcorders, and from the network. Image capture facility functions with any DirectX 8 compatible video source as well as some older VFW sources
• Interactive feature measurement tool
• Automatic calibration of SEM magnification
• Interactive image comparison tools (live overlay, correlation and image merging)
• Image portfolios capability allowing images of similar subjects to be saved as a group. Images in a portfolio can be of numerous popular or older file types, be of any resolution and be in any accessible location
• Multi-page TIFF image storage
• SEM control panel (stage and beam Quanta and XL compatible)

BallisticSEM Options
Motor drives
• Position-indexed substage motors (1 or both axes) with software control integrated into BallisticSEM interface. Positioning accuracy 0.1 degrees. Speeds adjustable between 1 and 40°/second.
Flatview™
• Images stored at 786 x 384 resolution in color or b/w compressed or uncompressed
• Requires at least one motor to have the position indexing option
• Flatview™ portfolios allow comparison of patterns on bullets with archives of known types.
Prerequisites
• BallisticSEM is available for Quanta 400 and 600 SEMs, XL40 and XL30 (with 100x 100 stages. Other stages on special order.
• W2000
• 1 spare RS232 port
• 1 spare SEM port (either 55 or 60 mm type)

XL Specific Options
• Second PC running W2000 and 1280/1024 24 bit video
• Ethernet connections between XL and second PC
• 1 or 2 video capture cards or DV sources (only if additional live channels required)

    

 

The above images show the substage (minus the cartridge examination plate) being imaged by the external optical camera and gantry system offered by Eastern Analytical. Our SurveyXT software also supports this optical camera to allow optical montages. Both BallisticSEM and SurveyXT support electron images as standard.


Ordering Information

BALSEM_01 BallisticSEM Software

Software to display and archive ballistic-sample images. Software runs only in 1280 x 1024 display mode Software supports Flatview where digitally controlled motors are present. (BALSEM_XT_MOT1 or BALSEM_XT_MOT2 see substages section)


Available from Eastern Analytical direct.

SurveyXT

Navigation tool for large samples in Quanta and XL Features

 

Microscope with optical camera

Features
• Fast, large-area electron and optical montages on Quanta and XL
• Flexible configurations
• Add-on for GSR-XT
• Stand-alone navigation tool
• EDS useful but not necessary
• Allows complex search geometries for GSR-XT
• Compatible with any image source (Quanta, Edax or optical camera).
• Point-and-click analysis of large samples
• Quanta interface look and feel

 

The view above on the left is an optical montage, and the one on the right is a BSD montage.

Both images generated automatically by Survey XT

Product description
Microscopists often need to examine the surfaces of large specimens looking for specific features of interest. These can be very small compared to the size of the object. One example might be the examination of an 8" silicon wafer looking for micron-sized contamination.

SurveyXT allows microscopists to carry out automatic imaging of the surface of specimens over areas as large as their microscope's stage travel. A master montage image is constructed at viewing-screen resolution so that the entire surface can be viewed. The montage is constructed from images taken from consecutively scanned fields. Each field can be defined to allow features as small as 0.5 microns to be examined in areas as large as 150mm x 150mm.

Fig. 1: BSD image of entire surface of 5", 1200-mesh plated diamond lap

Fig. 2: Optical image of diamond lap showing 1” diameter standard block

The program is also useful in general applications where the minimum magnification is restricted for optical or vacuum reasons and where an overview of the larger surface of the sample is required in order for find the areas of interest.

After the montage is constructed, the user can then examine fields for objects of interest. Each field can be examined at the original scan resolution, not the resolution of the montage, thus allowing very small features to be found, which would not otherwise be visible in the montage. If the user finds features of interest, the software allows that field to be revisited and a new, potentially higher-resolution image of the feature to be acquired.

Fig. 3: Area of montage (left) showing field highlighted. Image of field on right.

Fig. 4: Rescanned area showing high-atomic-number wear-debris particle (black particles are diamond).



Applications
• Wafer examination
• IC and PCB imaging
• Mineral – Rare-metal searches
• Mineral – Core-section analysis
• Biological/General - where low microscope magnification is limited
• Forensic - Finding and characterizing features on large specimens
• Museums - Characterization of features on large specimens
• Metallurgy - Manual wear debris analysis
• Metallurgy - Characterization of features on large samples, such as searching for inclusions in parts
Specifications
• Montages of areas up to range stage travel (150mm x 150mm on Q600)
• Field images can be acquired at any magnification, at resolutions of 4096 x 3200, 2048 x 1600, 1024 x 800 and 512 x 400 pixels
• Automatic (based on minimum feature size sought) and manual configuration of montage scan.
• Image can be acquired from any source in the microscope, or can be optical using the optional integrated optical microscope
• Montage as well as field images stored on disk.
• Point and classify analysis (X-ray required)
• Up to 4000 chemical classes (X-ray required) can be configured with up to 8 elements per class.
• Analytical results exported as comma-delimited files for use with Excel.
• Spectra stored in proprietary or MAS format (X-ray required) .
• Images stored as BMP or JPEG format.
Prerequisites
• Quanta without X-ray analysis - microscope only
• Quanta with X-ray analysis - microscope + EDS
• XL Upgrade possible

To order:

Part number SUR-XT_NS SurveyXT for Quanta SEMs

Part number SUR-XT_NSE SurveyXT for Quanta SEMs with embedded Edax EDS

Part number SUR-XT_NS SurveyXT for Quanta SEMs with standalone Edax EDS

Part number SUR-XT_XL SurveyXT for XL SEMs with standalone Edax EDS

Available directly from Eastern Analytical

eastern.analytical@gunshotresidue.com